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43results about "Optically investigating flaws/contamination" patented technology

System and method for imaging regions of interest

InactiveUS20050117017A1Increase imaging speedImprove data transfer rateColor television detailsOptically investigating flaws/contaminationRegion of interestImage sensor
A camera uses a map to retrieve image data pertaining to two or more region of interest segments (ROI segments) within the field-of-view (FOV) of the camera. The map identifies selected pixels of the image located in the region of interest segments. Image data corresponding to the image can be stored and the image data associated with the selected pixels can be accessed individually. In other embodiments, image data associated with the selected pixels is read off of the image sensor row-by-row or pixel-by-pixel. The camera can be included within an optical inspection system to analyze ROI segments on a target surface by transmitting only the image data associated with the ROI segments from the camera to an image processing system of the optical inspection system.
Owner:AGILENT TECH INC

Fruit surface defect detection method based on image marking

InactiveCN105424709AAccurate Defect DetectionStatistically accurateOptically investigating flaws/contaminationImage conversionVisual perception
A fruit surface defect detection method based on image marking includes the following steps that firstly, a surface picture of a to-be-detected fruit is taken and saved, and an original image is obtained; secondly; the original picture is uploaded to a server to be analyzed and processed; processing of the server includes the steps that a, the obtained original image is converted into a space where the visual system of human beings is applied, and an H component and an I component are extracted; b, dynamic threshold segmentation is performed on the H component; c, gray histogram statistics is performed on the I component, segmentation is performed through a fixed threshold method, and a threshold is selected between two wave peaks; d, the H value segmentation result and the I value segmentation result are operated, and a binary image with defect areas is obtained; denoising is performed on the obtained binary image; f, the binary image is enhanced, hole noise may exist in the defect areas, and filling is performed on the noise; g, the obtained binary image is marked, and the number and the area of defects are calculated; a detection result is output; labor intensity of workers is reduced, and production efficiency is improved.
Owner:SHAANXI UNIV OF SCI & TECH

Linear frequency modulation ultrasonic excitation-based infrared thermal wave nondestructive testing method and system

ActiveCN103926253AMaterial analysis using acoustic emission techniquesOptically investigating flaws/contaminationUltrasonic generatorTest sample
The invention discloses a linear frequency modulation ultrasonic excitation-based infrared thermal wave nondestructive testing method and system. The method comprises the following steps: S1, adjusting spatial positions of an ultrasonic excitation head and a tested sample, and switching on a switch of a cylinder pressing device to ensure that the ultrasonic excitation head is in close contact with the surface of the tested sample, controlling a signal generator to generate a linear frequency modulation pulse signal through a computer, and driving an ultrasonic generator and power amplifier unit to ensure that the ultrasonic power regularly changes according to the linear frequency modulation pulse signal; S2, starting an ultrasonic generator, and acquiring a surface thermal wave signal of the tested sample; and S3, processing the acquired surface thermal wave signal, extracting time-frequency domain characteristic information of the surface thermal wave signal, and integrating the time-frequency domain characteristic information to obtain a characteristic image for characterizing internal defects of the material. The system comprises an ultrasonic excitation device, the ultrasonic generator and power amplifier unit, the signal generator, a focal plane thermal infrared imager and the computer. The internal defects of the material can be rapidly and accurately detected by the method and the system.
Owner:HARBIN INST OF TECH

Multi-angle lighting device and collecting system

InactiveCN108535265AEasy to detectLow costOptically investigating flaws/contaminationGlass coverThree-dimensional space
The invention relates to the technical field of glass cover plate detection, in particular to a multi-angle lighting device. The multi-angle lighting device comprises a light source module and a control module for controlling the on and off and / or brightness of the light source module, the light source module comprises a plurality of light source components which are disposed at different lightingangles in a three-dimensional space and all face the same lighting area. By virtue of the light source module which face the same lighting area and can light at different lighting angles in a three-dimensional space, and the control module controlling the on and off and / or brightness of the light source module, the collection imaging and defect detection at different angles of a product to be detected can be realized. The multi-angle lighting device has the advantages of low cost, stable performance and low omission factor.
Owner:SHENZHEN NANOVISION CORP

Movable defect detection structure based on double rails

PendingCN107505332AQuick installation kitRealize unmanned inspection work modeOptically investigating flaws/contaminationDistance measurementVehicle frameEngineering
The invention relates to a movable defect detection structure based on double rails. The movable defect detection structure comprises a movable platform system, a rail detection system and a tunnel dome detection system, wherein the movable platform system comprises a frame and a movable wheel train located at the bottom of the frame; the movable wheel train is of a steel rail wheel pair type structure comprising a front wheel train and a rear wheel train; rapid connectors are mounted at the periphery of the frame; the rail detection system and the tunnel dome detection system are mounted on the movable platform system through the rapid connectors. The movable defect detection structure based on the double rails can be rapidly mounted and combined with peripheral equipment and instruments; especially, the movable defect detection structure capable of being adaptive to subway rails and a tunnel dome is provided aiming at the rail detection system and the tunnel dome detection system.
Owner:成都圭目机器人有限公司

Product packaging defect detection and identification method based on machine vision

PendingCN111968082AImage enhancementImage analysisFeature extractionMachine vision
The invention discloses a product packaging defect detection and recognition method based on machine vision. The method comprises steps that firstly, a product packaging processing image without surface defects is extracted; a defect image template feature database is established; feature extraction, detection and identification of the packaging image of the to-be-detected product are carried out;and finally, the unqualified packaged products are blown into the collecting box, and the qualified packaged products are conveyed by the conveying belt to be output. The method is advantaged in thatproblems that in the prior art, the product packaging defect detection error rate is high, and production efficiency is low are solved.
Owner:SHAANXI UNIV OF SCI & TECH

Semiconductor chip test system and method

ActiveCN109827970AReduce downtimeReduce in quantityOptically investigating flaws/contaminationIndividual semiconductor device testingElectrical connectionSemiconductor chip
The present invention provides a semiconductor chip test system. The system comprises: a test circuit; a test interface device comprising a plurality of probes to provide electrical connection betweena semiconductor chip to be tested and the test circuit so as to allow the test circuit to test the semiconductor chip to be tested; an image obtaining device configured to obtain images of the test interface device, wherein the probes are shown in the images; and a processor configured to detect the test interface device based on the obtained image to determine the possible defects in the test interface device and generate output signals based on the determination result of the defects. The detection for the test interface device is provided during the test of the semiconductor chip to prevent the test interface device from being taken out from the semiconductor chip test system as far as possible for detection so as to shorten the downtime of the semiconductor chip test system and save the cost.
Owner:INTEL PROD CHENGDU CO LTD +1

Welding spot appearance detection method based on machine vision

PendingCN111307812AEasy to collectThe analysis result is accurateOptically investigating flaws/contaminationImaging processingMachine vision
The invention discloses a welding spot appearance detection method based on machine vision, belongs to the technical field of welding spot appearance detection and discloses a welding spot appearancedetection method based on machine vision. The method comprises the following steps, firstly, a to-be-detected workpiece is fixed on a conveyor belt; a technician adjusts the positions of the workpieceand the camera; the high-definition camera is close to a workpiece welding spot; then the high-definition camera exposes the workpiece for multiple times to obtain a plurality of high-definition images at the welding spots and transmits the high-definition images to the computer; image processing, the image analysis module performs comparative analysis on the processed image and the template image; when the difference degree between the workpiece image and the template is relatively large; the image analysis module sends an analysis result to the alarm module, Meanwhile, the image analysis module sends the analysis result to a technician, so that welding spot images of a workpiece can be conveniently collected, and an accurate welding spot appearance analysis result can be obtained by comparing and analyzing the welding spot images of different sizes with corresponding templates.
Owner:NANCHANG INST OF TECH

Cylinder sleeve surface defect detection method, system and device based on deep learning

The invention belongs to the technical field of cylinder sleeve defect detection, and particularly relates to a cylinder sleeve surface defect detection method, system and device based on deep learning, and the method comprises the steps: collecting the real-time surface image data of a cylinder sleeve product on a production line in a regional manner, wherein the product surface image data acquired in different areas at least comprises images of the end face, the inner wall, the outer wall and the skirt edge of the cylinder; filtering and segmenting the image data to obtain to-be-detected area image data of the end face, the inner wall, the outer wall and the skirt edge of the product image; masking the image data of the to-be-detected area to determine the image data of the target detection area of the cylinder sleeve product; and using the trained and optimized classification network model to classify and identify the image data of the target detection area, and acquiring and removing cylinder sleeve products with defects on the surfaces by a sorting system. The invention is combined with deep learning technology to realize rapid and efficient detection of the surface defects of the cylinder sleeve, improves the efficiency, and has a good application value.
Owner:ZHENGZHOU JINHUI COMP SYST ENG

Defect recognition device and system based on image recognition technology

PendingCN112697806AReduce distractionsCancel noiseImage enhancementImage analysisComputer hardwareNetwork socket
The invention discloses a defect recognition device and system based on an image recognition technology. The defect recognition device comprises a detection system module and a shell; illuminating lamps are fixedly arranged at the four corners of the surface of the front end of the shell in an embedded mode; a CCD camera is fixedly arranged in the middle of the surface of the front end of the shell in an embedded mode, and a power socket and a network socket are sequentially formed in the surface of the right end of the shell from front to back; and a display screen is fixed to the upper end surface of the shell in an embedded mode, a storage battery is fixedly arranged at the bottom in the shell through screws, a driving main board is arranged above the storage battery and fixed to the inner wall of the shell through screws, and a detection system module is fixedly arranged on the upper end surface of the driving main board through welding. The defect recognition device and system based on the image recognition technology have the advantages of being high in image information feature online detection and extraction efficiency and accuracy, high in detection precision, capable of labeling defect positions and convenient to compare and check.
Owner:南京英诺森软件科技有限公司

Display screen defect monitoring system based on image recognition and detection method thereof

The invention provides a display screen defect monitoring system based on image recognition and a detection method thereof, and relates to the technical field of screen defect detection. The display screen defect monitoring system comprises a detection assembly line and a main control computer, and the detection assembly line comprises at least one detection station used for detecting a display screen; the detection station is a darkroom in which a lighting jig for loading a display screen and an image acquisition module are arranged, the main control computer comprises an image processing module, an image comparison module, a good product estimation module and a sample library, and a plurality of illuminating lamps are arranged in the detection station. According to the invention, the camera is used for photographing, the image processing module is used for processing the obtained picture, and the image comparison module is used for comparing the processed picture with a non-defective product pre-estimated picture, so that the defective products in the display screen can be effectively detected, compared with the traditional manual detection, the omission ratio and the false detection ratio are greatly reduced, the detection speed is high, the detection precision is high, and the detection efficiency of the display screen is effectively improved.
Owner:深圳汇义科技有限公司

Engine crankshaft inspection method

The invention discloses an engine crankshaft inspection method, which comprises the following steps of: performing magnetic powder inspection on an engine crankshaft by using a continuous method, and judging that the engine crankshaft without magnetic traces on the surface is qualified; judging the magnetic mark position of the engine crankshaft with the magnetic marks on the surface; if the magnetic trace exists on the parting surface (i) or the parting surface and the non-parting surface (ii), judging the shape of the magnetic trace; if the magnetic traces are fibrous, removing magnetic powder, and then using a residual magnetism method for conducting magnetic powder inspection on the engine crankshaft; and if no magnetic trace is found by using the residual magnetism method, determining that the type of the magnetic trace is a streamline type magnetic trace, and determining that the engine crankshaft is qualified. After the engine crankshaft sorted by the inspection method is loaded and used, the fatigue resistance can be comparable with that of a qualified product judged by an existing method, the reliability is high, and no use risk exists in loading. For the same batch of engine crankshafts, the rejection rate in the prior art is more than 10%, and the rejection rate of the test method is only 0.05%, so that the misjudgment rate is greatly reduced.
Owner:DONGFENG COMML VEHICLE CO LTD
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