Fabrication Process Using Circuit-on-Wire,Test method for nonvolatile memory

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2 results about "Cons" patented technology

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In computer programming, cons (/ˈkɒnz/ or /ˈkɒns/) is a fundamental function in most dialects of the Lisp programming language. cons constructs memory objects which hold two values or pointers to values. These objects are referred to as (cons) cells, conses, non-atomic s-expressions ("NATSes"), or (cons) pairs. In Lisp jargon, the expression "to cons x onto y" means to construct a new object with (cons x y). The resulting pair has a left half, referred to as the car (the first element, or content of address register), and a right half (the second element, or content of decrement register), referred to as the cdr.

Fabrication Process Using Circuit-on-Wire

ActiveUS20150221671A1Solid-state devicesSemiconductor/solid-state device manufacturingActive matrixElectrical connection

A method is provided for forming a circuit-on-wire (CoW) assembly. The method forms a flexible line with a plurality of periodic alignment marks used as a guide to place CoW devices overlying a surface of the flexible line. The CoW devices may be LEDs, capacitors, diodes, photodiodes, resistors, thin-film transistors, or combinations of the above-listed elements. The flexible line may be a conductive material, such as a metal wire, and the periodic alignment marks may be vias formed through the wire. If the flexible line is electrically conductive, an electrically conductive adhesive may be applied to the electrically conductive line, so that an electrical connection is formed between the CoW devices and the electrically conductive line. Subsequent to placing the CON devices, processes may be formed on the flexible line and CoW devices such as lithographic etching and thin-film deposition. An active matrix array using CoW devices is also presented.

Owner:SHARP KK

Test method for nonvolatile memory

InactiveUS20060048023A1Simple processSimple methodRead-only memoriesDigital storageData terminalComputer terminal

A control terminal section CON and an address terminal section ADDR of a test apparatus are respectively connected to those of a flash memory. A first to an (n−1) -th input and output terminal of the test apparatus are connected to data terminals of the flash memory. Further, an n-th and an (n+1)-th input and output terminal of the test apparatus are connected to a multifunctional terminal of the flash memory. The (n+1)-th input and output terminal is established as a dedicated terminal to receive data supplied to the test apparatus. The first to the n-th input and output terminal of the test apparatus are used to output the writing data to the flash memory, while the (n+1)-th input and output terminal is used to detect the completion signal output from the flash memory.

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Owner:LAPIS SEMICON CO LTD

2 results about "Cons" patented technology

Fabrication Process Using Circuit-on-Wire

Test method for nonvolatile memory

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