The invention provides a read-write test method for
memory chip flash by bypassing a customized
system-on-
chip chip. Comprising the following steps: sending multiple groups of specific binary sequence codes to a data line TDI of a JTAG port through a
parallel port of a computer; with the help of an
oscilloscope, calculating the instruction length, the data length and the highest transmission speed of the JTAG interface through code streams observed on a data line TDO of the JTAG interface; then, converting an operation instruction corresponding to the specification and model of the flash
chip needing to be subjected to read-write test into a corresponding binary sequence code according to characteristic parameters of a JTAG interface, and finally loading the binary sequence code to a
parallel port card of a computer, so that the
parallel port card can automatically match the level of the JTAG interface and shift the sequence code into the pin of the
system-on-chip according to the sequence; meanwhile, isolating the internal
control logic circuit of the
system-on-chip automatically; finally, sending the binary sequence code accurately to the
control bus of the flash chip, and realizing the full-automatic read-write test of the flash storage chip.