Semiconductor device and manufacturing method thereof

A semiconductor and device technology, applied in the field of semiconductor devices, can solve the problems that the bonding wire cannot be wrapped in the package PC, exposed, and the bending height is high

Inactive Publication Date: 2004-04-28
LAPIS SEMICON CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] However, if the bending height is too high in this case, th

Method used

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  • Semiconductor device and manufacturing method thereof
  • Semiconductor device and manufacturing method thereof
  • Semiconductor device and manufacturing method thereof

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Embodiment Construction

[0026] The following is an explanation of related embodiments of a semiconductor device and its manufacturing method proposed according to the present invention. FIG. 1 is a schematic diagram illustrating a first embodiment. Just as shown in the schematic plan view in FIG. 1(a), the semiconductor device of the first embodiment has an LOC structure, and is provided with an on-chip semiconductor element 1, and a plurality of pins L and common lines 2a and 2b pass through the semiconductor element 1. The insulating tape T on the substrate 1a is connected to provide electrical connections for the electrode pads that handle common signals among the many electrode pads on the substrate 1a, and the bonding wire W that electrically connects the electrode pads to the pin L.

[0027] In this semiconductor device, the common line 2a constitutes a power line by being electrically connected to the electrode pad P1 connected to the power supply, and the common line 2b constitutes a ground wire

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Abstract

A semiconductor device includes a plurality of electrode pads P provided on a semiconductor element 1, leads L coupled with the electrode pads via bonding wires W and common lines 2a and 2b provided on the semiconductor element 1 that achieve electrical continuity for electrode pads that handle a common signal among the plurality of electrode pads. At least the surfaces of the common lines 2a and 2b are covered with an insulating member, i.e., a second insulating adhesive tape. With this, the loops of the bonding wires can be lowered, thereby achieving a thinner package.

Description

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Claims

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Application Information

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Owner LAPIS SEMICON CO LTD
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