Electrostatic chuck with magnetic cathode liner for critical dimension (CD) tuning

Inactive Publication Date: 2015-08-06
APPLIED MATERIALS INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0009]In another embodiment, a semiconductor processing system includes a chamber coupled to an evacuation device, a gas inlet device, a plasma ignition device, and a detector. A computing device is coupled with the plasma ignition device. A voltage source is coupled with a sample holder that includes an electrostatic chuck (ESC). The ESC is disposed in the chamber and includes a cathode region. The ESC also includes a wafer processing region dis

Problems solved by technology

Long line lengths in a heat transfer fluid loop, and the large heat transfer fluid volumes associated with such long line lengths are detrimental to temperature control response times. Point-of-use systems are one means to reduce flu

Method used

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  • Electrostatic chuck with magnetic cathode liner for critical dimension (CD) tuning
  • Electrostatic chuck with magnetic cathode liner for critical dimension (CD) tuning
  • Electrostatic chuck with magnetic cathode liner for critical dimension (CD) tuning

Examples

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Embodiment Construction

[0025]Electrostatic chucks with magnetic cathode liners for critical dimension (CD) tuning are described. In the following description, numerous specific details are set forth, such as specific chuck and / or chamber configurations, in order to provide a thorough understanding of embodiments of the present invention. It will be apparent to one skilled in the art that embodiments of the present invention may be practiced without these specific details. In other instances, well-known aspects, such as etch processing in the presence of a wafer supported by a chuck, are not described in detail in order to not unnecessarily obscure embodiments of the present invention. Furthermore, it is to be understood that the various embodiments shown in the Figures are illustrative representations and are not necessarily drawn to scale.

[0026]One or more embodiments described herein are directed to a magnetic cathode liner for critical dimension (CD) tuning during plasma processing. For example, to offe

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Abstract

Electrostatic chucks with magnetic cathode liners for critical dimension (CD) tuning are described. For example, an electrostatic chuck (ESC) includes a cathode region. A wafer processing region is disposed above the cathode region. A magnetic cathode liner surrounds the cathode region, below the wafer processing region. The magnetic cathode liner is configured to provide magnetic field tuning capability for the ESC.

Description

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Claims

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Application Information

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Owner APPLIED MATERIALS INC
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