Resistance variable memory device performing program and verification operation

A resistance memory and programming current technology, applied in static memory, read-only memory, memory system, etc., can solve the problem of non-volatility in DRAM operation characteristics

Inactive Publication Date: 2010-06-09
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The presence of capacitors makes DRAM non-volatile in its operating characteristics

Method used

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Embodiment Construction

[0023] Embodiments of the invention will now be described in some additional detail with reference to the drawings. However, the invention may be embodied in different forms and should not be construed as limited to only the illustrated embodiments. Rather, these embodiments are presented as teaching examples. Throughout the drawings and specification, the same reference numerals and symbols are used to refer to the same or similar elements.

[0024] Throughout the description below, phase change memory is used as an example of a broader class of variable resistance memory devices. Embodiments of the present invention cover all classes of variable resistance memory devices, not limited to phase change memory.

[0025] figure 1 is a block diagram of a variable resistance memory device according to an embodiment of the present invention. refer to figure 1 , variable resistance memory device 100 includes memory cell array 110, write and verify driver 120, write buffer 130, d...

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Abstract

A variable resistance memory device includes: a memory cell array comprising a plurality of memory cells, a pulse shifter shifting a plurality of program pulses to generate a plurality of shifted program pulses, a write and verification driver receiving the plurality of shifted program pulses to provide a program current that varies with the plurality of shifted program pulses to the plurality of memory cells, and control logic providing the plurality of program pulses to the pulse shifter and the write and verification driver during a program / verification operation, such at least two write data bits are programmed to the memory cell array in parallel during the program / verification operation.

Description

[0001] Cross References to Related Applications [0002] This US nonprovisional patent application claims priority under 35 U.S.C. §119 to Korean Patent Application No. 2008-102043 filed on October 17, 2008, the subject matter of which is incorporated herein by reference. technical field [0003] The present disclosure relates to semiconductor memory devices. More particularly, the present disclosure relates to variable resistance memory devices that perform program and verify operations. Background technique [0004] Semiconductor memory devices can generally be classified into random access memory (RAM) and read only memory (ROM). ROM is a type of non-volatile memory capable of retaining stored data without power being applied. ROM includes programmable ROM (PROM), erasable programmable ROM (EPROM), and electrically erasable programmable ROM (EEPROM) including flash memory. Flash memory can be further classified into NOR type flash memory and NAND type flash memory. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C16/02G11C13/00G06F12/00
CPCG11C13/0069G11C11/5678G11C13/0004G11C2013/0088G11C2013/0092G11C13/0064G11C16/34G11C16/12G11C16/10
Inventor 黄荣南严昌镕
Owner SAMSUNG ELECTRONICS CO LTD
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