Low-voltage floating gate photoelectric memory and preparation method thereof
A technology of memory and charge storage layer, applied in the field of memory, to achieve the effects of low cost, easy processing, and compatibility with large-area manufacturing
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Example Embodiment
[0036] Example 1
[0037] The specific preparation steps are as follows:
[0038] (1) First, a 20nm aluminum gate electrode was evaporated on a glass substrate;
[0039] (2) The first and second dielectric layers were then prepared by spin-coating PMMA toluene and PVA aqueous solutions with concentrations of 10 mg / ml and 2.5 mg / ml, respectively. minutes, with thicknesses of 43nm and 5nm;
[0040] (3) PS (2 mg / ml) and CsPbBr 3 The quantum dot solution (10 mg / ml) was mixed in a volume ratio of 10:3, the spin coating speed was 2000 rpm, the time was 40 seconds, and the residual solvent was removed by heating at 80 °C for 30 min;
[0041] (4) Finally, 50 nm pentacene semiconductor material and 80 nm thick gold electrode were evaporated. The reticle channel length is 50 μm and the width is 1 mm, which is denoted as Cs−30 device. In addition, only PS solution was spin-coated on the second gate dielectric layer as a comparative device, denoted as Cs−0 device.
[0042] fi
Example Embodiment
[0043] Example 2
[0044] The specific preparation steps are as follows:
[0045] (1) First, a 10nm aluminum gate electrode was evaporated on a glass substrate;
[0046](2) The first and second dielectric layers were then prepared by spin-coating PVP toluene and PVA aqueous solutions with concentrations of 8 mg / ml and 1 mg / ml, respectively. minute;
[0047] (3) PS (1 mg / ml) and CsPbBr 3 The quantum dot solution (1 mg / ml) was mixed at a volume ratio of 10:2, the spin coating speed was 800 rpm, the time was 25 seconds, and the residual solvent was removed by heating at 60 °C for 20 min;
[0048] (4) Finally, a 25 nm pentacene semiconductor material and a 25 nm thick gold electrode were evaporated. The reticle channel length is 50 microns and the width is 1 mm.
Example Embodiment
[0049] Example 3
[0050] The specific preparation steps are as follows:
[0051] (1) First, a 30nm aluminum gate electrode was evaporated on a glass substrate;
[0052] (2) The first and second dielectric layers were then prepared by spin-coating PS toluene and PVA aqueous solutions with concentrations of 15 mg / ml and 10 mg / ml, respectively. minute;
[0053] (3) PS (10 mg / ml) and CsPbBr 3 The quantum dot solution (10 mg / ml) was mixed in a volume ratio of 10:2, the spin coating speed was 3000 rpm, the time was 60 seconds, and the residual solvent was removed by heating at 100 °C for 60 min;
[0054] (4) Finally, 80 nm pentacene semiconductor material and 150 nm thick gold electrode were evaporated. The reticle channel length is 50 microns and the width is 1 mm.
PUM
Property | Measurement | Unit |
---|---|---|
Thickness | aaaaa | aaaaa |
Thickness | aaaaa | aaaaa |
Thickness | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap