Wafer clamp and cleaning method thereof

A wafer jig, a jig technology, which is applied to cleaning methods and utensils, cleaning methods using liquids, chemical instruments and methods, etc. Effective cleaning, low manufacturing cost and easy operation

Pending Publication Date: 2021-03-26
CHENGDU KINGBRI FREQUENCY TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

This patented technology provides an improved way for wafers during production without being contaminated with any impurities or particles from previous processes. It simplifies its design while reducing costs compared to existing methods like vacuum suction systems used earlier designs. Additionally, this new solution allows for complete removal of all unwanted substances before further processing steps are performed on them.

Problems solved by technology

This patented describes how it can help keep your equipment free from contamination by unwanted particles that may stick onto its surfaces during manufacturing processes such as semiconductor wafers. These particles could cause defects in electronic components if they were present at certain locations within the process chamber where these parts should also work properly. To prevent this issue, an effective solution needs to be developed for maintaining good purity levels while keeping any residual material away without causing damage.

Method used

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  • Wafer clamp and cleaning method thereof
  • Wafer clamp and cleaning method thereof
  • Wafer clamp and cleaning method thereof

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Embodiment Construction

[0028] The present invention will be further described below in conjunction with accompanying drawing and specific embodiment:

[0029] Such as Figure 1 to Figure 7 As shown, the cleaning method of a kind of wafer holder provided by the present invention comprises the following steps:

[0030] S1. Soaking in nitric acid solution: put the jig into the soaking pool, pour in nitric acid solution for soaking.

[0031] In step S1, the height of the nitric acid solution poured into the immersion tank is greater than the height of the jig, and the jig is immersed in the nitric acid solution for 15 minutes for a single immersion time, and silver flakes on the surface are removed.

[0032] S2. Rinse with deionized water: rinse the nitric acid solution on the fixture soaked in step S1 with deionized water, and at the same time rinse off attached physical impurities.

[0033] The flushing time in step S2 is 300 seconds, and the resistance of the deionized water used for flushing should b

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Abstract

The invention discloses a wafer clamp and a cleaning method. The method comprises the following steps of firstly, nitric acid solution soaking, wherein the clamp is put into a soaking pool, and a nitric acid solution is poured for soaking; secondly, deionized water washing, wherein the nitric acid solution on the clamp soaked in the step S1 is washed with deionized water; thirdly, silver-chromiumstripping solution soaking, wherein the clamp washed in the step S2 is put into a new soaking pool, and a silver-chromium stripping solution is poured for soaking; fourthly, deionized water washing, wherein the silver-chromium stripping solution on the clamp soaked in the step S3 is washed away; fifthly, ultrasonic cleaning, wherein the clamp cleaned in the step S4 is put into an ultrasonic pool to be subjected to ultrasonic cleaning; sixthly, dehydration, wherein dehydration treatment is conducted on the clamp subjected to ultrasonic cleaning in the step S5 through absolute ethyl alcohol, andthe clamp is washed for 300 seconds; and seventhly, baking, wherein the clamp dehydrated in the step S6 is put into a baking oven of 80 +/-10 DEG C to be baked for 30-60 minutes to finish clamp cleaning.

Description

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Claims

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Application Information

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Owner CHENGDU KINGBRI FREQUENCY TECH
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