The invention discloses a parameter-controllable single / multiple
abrasive particle high-speed
etching experimental device. A main shaft of a
machine tool drives a rotary disc to rotate around the mainshaft, a workpiece is fixed to the surface of a side wall of a disc matrix, and the disc can move on the Y-axis under the driving of the main shaft to change the
etching depth; a precise moving
workbench can drive a rotary pinboard and an
etching device to move on the X-axis direction, the rotary pinboard can clamp three groups of etching devices through a clamp plate; the three groups of etchingdevices are respectively provided with single
abrasive particle, two
abrasive particles, four abrasive particles and a distance fine-adjusting device, and the distance fine-adjusting device can adjust a abrasive particle pressure head to slightly move on the Y-axis direction so as to adjust the exposed height of the abrasive particle. The etching space can be adjusted by moving the
workbench along the X-axis direction, and the rotary pinboard rotates by taking the Y-axis direction as the axle; a high-speed industrial camera can match with a
dynamometer to complete tool setting and perform real-time
shoot to monitor the abrasive particle state. The experimental device can be applied to single / multiple abrasive particle high-speed etching experiments under multiparameter orthogonal.