Method for modifying light absorption layer

a technology of light absorption layer and light absorption layer, which is applied in the direction of solid-state diffusion coating, coating, vacuum evaporation coating, etc., can solve the problems of high toxicity and pollution, high cost of hydrogen sulfide (hsub>2/sub>s) gas, and high fabrication cos

Active Publication Date: 2013-07-04
IND TECH RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent text explains that the use of hydrogen sulfide gas in the sulfurization step has high toxicity, is expensive, and can cause poor uniformity of the light absorption layer in the fabrication process. The technical effect of the patent is to provide an alternative to the use of hydrogen sulfide gas to reduce toxicity and pollution, lower costs, and improve the uniformity of the light absorption layer.

Problems solved by technology

However, the hydrogen sulfide (H2S) gas used in the sulfurization step has high toxicity and high pollution, and the cost of the hydrogen sulfide (H2S) gas is expensive making fabrication costs high.
Furthermore, because the reaction between the hydrogen sulfide (H2S) gas and the CIGS light absorption layer is a solid-gas reaction, if the gas is non-uniformly distributed in the reactin chamber, a poor uniformity of the light absorption layer will be obtained.

Method used

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Examples

Experimental program
Comparison scheme
Effect test

example

Example 1

[0031]The molybdenum (Mo) was coated on a soda-lime glass (SLG) substrate by a sputter method. Then, the Mo / SLG substrate was placed in a vapor deposition chamber, and the copper (Cu), indium (In), gallium (Ga) and selenium (Se) elements were deposited on the Mo / SLG substrate by a heating system to form a CIGS precursor film.

[0032]Then, the slurry containing sulfur (S) element was coated on the CIGS precursor film by a capillary coating method. The CIGS precursor film was placed on a heater plate and the slurry was dipped on it. Then, a glass cover plate was put above the CIGS precursor film. The heater was heated to about 115.2° C. (higher than the melting point of sulfur (S)), and thus the slurry containing sulfur (S) element was uniformly distributed on the CIGS precursor film by capillary force and the solvent in the slurry was removed by the heater.

[0033]Then, after the CIGS precursor film was placed and a temperature thereof was at room temperature, the glass cover wa...

example 2

[0034]The CdS (as buffer layer), iZnO / AZO (as transparent conducting layer) and top electrode were sequential formed on the light absorption layer to form a solar cell. The solar cell was divided into six smaller solar cells (Cell 1-Cell 6). Table 1 shows that photoelectric efficiency test of the six solar cells.

[0035]Table 1 shows the open-circuit voltage (Voc), short-circuit current (Jsc), fill factor, photoelectric conversion efficiency (%), series resistance (Rs) and shunt resistance (Rsh) of Example 1. The open-circuit voltage (Voc) was about 0.56-0.59 V, the short-circuit current (Jsc) was about 20-24 mA / cm2, the fill factor was about 67-69, and the photoelectric conversion efficiency (%) of the Example 1 was about 8-9.2%.

TABLE 1photoelectricVocJscF.F.conversionRshRs(V)(mA / cm2) (%)efficiency (%)(Ohm)(Ohm)Cell 10.5820.492698.242359511Cell 20.5822.274698.910214710Cell 30.5920.382698.396434611Cell 40.5621.839678.309156010Cell 50.5723.774689.189158810Cell 60.5821.542698.596243011

example 3

[0039]The fabrication method of Example 3 was the same as that of Example 2, except that the thermal process of Example 3 was conducted under 1 torr pressure. Table 3 shows the open-circuit voltage (Voc), short-circuit current (Jsc), fill factor, photoelectric conversion efficiency (%), series resistance (Rs) and shunt resistance (Rsh) of Example 3.

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PUM

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Abstract

The disclosure discloses a method for modifying the light absorption layer, including: (a) providing a substrate; (b) forming a light absorption layer on the substrate, wherein the light absorption layer includes a Group IB element, Group IIIA element and Group VIA element; (c) forming a slurry on the light absorption layer, wherein the slurry includes a Group VIA element; and (d) conducting a thermal process for the light absorption layer with the slurry.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]This application claims priority of Taiwan Patent Application No. 100149119, filed on Dec. 28, 2011, the entirety of which is incorporated by reference herein.TECHNICAL FIELD[0002]The present disclosure relates to a method for modifying a light absorption layer, and in particular relates to a method for modifying a CIGS light absorption layer.BACKGROUNDDescription of the Related Art[0003]Technological development in the solar cell industry is driven by global environmental concerns and raw material prices. Among the various solar cells developed, CIGS thin film (Cu(In,Ga)Se2) solar cells have become the subject of considerable interest due to advantages of high conversion efficiency, high stability, low cost, and large area fabrication ability.[0004]A CIGS compound is made by a Group IB-IIIA-VIA compound and has a chalcopyrite structure. The Group IB-IIIA-VIA compound is a direct band gap semiconductor material that is used as a light abs...

Claims

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Application Information

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Patent Type & Authority Applications(United States)
IPC IPC(8): H01L31/18
CPCC23C8/62C23C10/30C23C14/0623C23C14/5866Y02E10/541H01L21/02491H01L21/02568H01L21/02664H01L31/0322H01L21/02422
Inventor CHEN, WEI-CHIENCHENG, LUNG-TENGCHIOU, DING-WENHSIEH, TUNG-PO
Owner IND TECH RES INST
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