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8 results about "Sapphire" patented technology

Sapphire is a precious gemstone, a variety of the mineral corundum, consisting of aluminum oxide (α-Al₂O₃) with trace amounts of elements such as iron, titanium, chromium, copper, or magnesium. It is typically blue, but natural "fancy" sapphires also occur in yellow, purple, orange, and green colors; "parti sapphires" show two or more colors. The only color corundum stone that the term sapphire is not used for is red, which is called a ruby. Pink colored corundum may be either classified as ruby or sapphire depending on locale. Commonly, natural sapphires are cut and polished into gemstones and worn in jewelry. They also may be created synthetically in laboratories for industrial or decorative purposes in large crystal boules. Because of the remarkable hardness of sapphires – 9 on the Mohs scale (the third hardest mineral, after diamond at 10 and moissanite at 9.5) – sapphires are also used in some non-ornamental applications, such as infrared optical components, high-durability windows, wristwatch crystals and movement bearings, and very thin electronic wafers, which are used as the insulating substrates of special-purpose solid-state electronics such as integrated circuits and GaN-based blue LEDs.

Reactor and method of processing a semiconductor substrate

InactiveUSRE37546E1Accurately determineEliminate needThermometer detailsRadiation pyrometryGas syringeEngineering
A reactor for processing a substrate includes a first housing defining a processing chamber and supporting a light source and a second housing rotatably supported in the first housing and adapted to rotatably support the substrate in the processing chamber. A heater for heating the substrate is supported by the first housing and is enclosed in the second housing. The reactor further includes at least one gas injector for injecting at least one gas into the processing chamber onto a discrete area of the substrate and a photon density sensor extending into the first housing for measuring the temperature of the substrate. The photon density sensor is adapted to move between a first position wherein the photon density sensor is directed to the light source and a second position wherein the photon density sensor is positioned for directing toward the substrate. Preferably, the communication cables comprise optical communication cables, for example sapphire or quartz communication cables. A method of processing a semiconductor substrate includes supporting the substrate in a sealed processing chamber. The substrate is rotated and heated in the processing chamber in which at least one reactant gas is injected. A photon density sensor for measuring the temperature of the substrate is positioned in the processing chamber and is first directed to a light, which is provided in the chamber for measuring the incident photon density from the light and then repositioned to direct the photon density sensor to the substrate to measure the reflection of the light off the substrate. The incident photon density is compared to the reflected light to calculate the substrate temperature.
Owner:KOKUSAI SEMICON EQUIP CORP

GaN single crystal manufacturing device

ActiveCN113026107AImprove intuitivenessImprove reaction efficiencyPolycrystalline material growthFrom chemically reactive gasesThermal dilatationSingle crystal
The invention relates to the technical field of GaN single crystal preparation, and discloses a GaN single crystal manufacturing device which comprises a quartz reaction pipe, a connecting flange and a separating flange. A high-temperature electric furnace matched with the quartz reaction pipe is annularly arranged on the outer side of the quartz reaction pipe. A quartz guide inlet pipe, a quartz guide gas pipe, a quartz inner container, a quartz outer container, a quartz Ga groove, a quartz spiral reaction pipe, a quartz flange connecting pipe, a quartz stepped outer frame, an inner spray pipe and a middle spray pipe are arranged in the quartz reaction pipe; and a flange plate of the quartz inner container is clamped between two flange plates of the connecting flange. According to the manufacturing device of the GaN single crystal, an HVPE method and an MOCVD method are used in the same device to control the growth of the GaN single crystal, so that the situation that a gallium nitride crystal is cracked when the gallium nitride crystal grows thick or is cooled due to stress caused by a lattice constant and a thermal expansion number can be effectively avoided, and the grown gallium nitride is easy to strip from sapphire when being cooled. The manufacturing and production cost of the product is effectively reduced.
Owner:WUXI WUYUE SEMICON CO LTD

Czochralski method-based crystal growth interface shape detection method and device

ActiveCN113417004AStable outputImprove qualityBy pulling from meltSeed crystalSapphire
The invention relates to a czochralski method-based crystal growth interface shape detection method and device. The method comprises the steps that: a seed crystal temperature T and an interface electromotive force U at the same time in a crystal growth process are collected, and a T-U curve of the interface electromotive force U changing with the seed crystal temperature T is obtained; the change trend of the shape of a crystal growth interface in real time is judged by observing the deviation between the T-U curve and a reference line, wherein the reference line is a straight line passing through the starting point of the T-U curve, and the slope of the straight line is the Seebeck coefficient of the crystal. The invention also relates to a device used by the method. The detection method provided by the invention can detect the change trend of the shape of the crystal growth interface in real time in the crystal growth process, and can be applied to Czochralski method growth equipment for various single crystals such as lithium niobate, lithium tantalate, sapphire, yttrium aluminum garnet and the like.
Owner:SUN YAT SEN UNIV
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