Patents
Literature
Hiro is an intelligent assistant for R&D personnel, combined with Patent DNA, to facilitate innovative research.
Hiro

17 results about "Chemical vapor deposition" patented technology

Chemical vapor deposition (CVD) is a vacuum deposition method used to produce high quality, high-performance, solid materials. The process is often used in the semiconductor industry to produce thin films.

Super-clean graphene and preparation method thereof

ActiveCN108069416ASimple structureRaw material safetyGrapheneGraphiteGraphene
The invention discloses super-clean graphene and a preparation method thereof. The preparation method of the super-clean graphene comprises the following steps: putting foam copper on a copper substrate, and attaching; leading carbon source gas and hydrogen to perform chemical vapor deposition; after deposition is completed, obtaining the super-clean graphene at the contact surface of the copper substrate and the foam copper. The preparation method has the advantages that the preparation method is simple and is suitable for large-scale production, the continuous clean area reaches the sub-centimeter level, and the preparation method is suitable for the fields of electronics, optics and the like.
Owner:PEKING UNIV

Semiconductor device with contact etching stop layer and forming method thereof

InactiveCN101740498AAvoid phenomena such as poor reliabilityAvoid damageSemiconductor/solid-state device detailsSolid-state devicesHigh densityGate oxide
The invention discloses a method for forming a semiconductor device with a contact etching stop layer, which comprises the following steps of: providing a substrate on which at least one grid structure is formed; putting the substrate in a settling chamber to carry out the settlement of the contact etching stop layer; oxidizing the contact etching stop layer in situ to form an oxide film on the surface of the contact etching stop layer; taking out the substrate on which the oxide film is formed; and forming an interlayer dielectric layer on the oxide film by high-density plasma chemical vapour deposition equipment. The invention also discloses the semiconductor device with the contact etching stop layer. The semiconductor device with the contact etching stop layer and the forming method thereof of the invention can effectively prevent damages which are caused by using the high-density and large-power plasma in the step of settling the interlayer dielectric layer to a gate oxide layer and voids phenomena of device performance drift, device reliability reduction and the like.
Owner:SEMICON MFG INT (BEIJING) CORP

5G-based high-performance electromagnetic shielding material and preparation method thereof

InactiveCN111875921AImprove absorbing performanceLight in massMagnetic/electric field screeningCarbide siliconNanowire
The invention discloses a 5G-based high-performance electromagnetic shielding material, of which the volume density is less than 2.5 g / cm3 and the electromagnetic shielding efficiency is greater than85dB; the high-performance electromagnetic shielding material is composed of foamy carbon, silicon carbide nanowires, graphene and phenolic resin. The preparation method comprises the following steps:taking organic foam as a raw material, carrying out pyrolysis at high temperature to prepare foam carbon, then carrying out in-situ growth of silicon carbide nanowires in the foam carbon by adoptinga chemical vapor deposition (CVI) method and Ni catalysis to obtain a silicon carbide nanowire reinforced foam carbon matrix, and then carrying out vacuum pressure impregnation with graphene modifiedresin, thereby finally obtaining the silicon carbide nanowire reinforced foam carbon material of the graphene modified resin. The material has a good shielding effect on high-frequency electromagneticwaves, the shielding bandwidth is large, the heat dissipation performance is good, and meanwhile structure and function integration is achieved.
Owner:SUZHOU HONGJIU AVIATION THERMAL MATERIALS TECH CO LTD

Multilayer body and method for producing same

InactiveCN1738712ARubber layered productsCoated surfacePolymer science
An object of the invention is to provide a laminate which is good in adhesiveness between a substrate and a thin film laminated thereon by a dry film-forming method such as a chemical vapor growth method or a vacuum evaporation method even if the substrate is a polymer substrate made of a nonpolar polymer; and a process for producing the same. In order to attain the above-mentioned object, the invention provides a laminate comprising a polymer substrate, a primer layer comprising a cyclized rubber which is a conjugated diene polymer cyclized product or a derivative thereof, the layer being formed on the surface of the polymer substrate, and a thin film laminated on the surface of the primer layer by a dry film-forming method; and a process for producing the same. The present invention also provides a laminate comprising a polymer substrate in which a cyclized rubber which is a conjugated diene polymer cyclized product or a derivative thereof is incorporated into a polymer-molding material, and a thin film laminated on the surface of the polymer substrate by a dry film-forming process; and a process for producing the same.
Owner:ZEON CORP

Method for preparing cubic boron nitride single crystal-film homogeneous P-N junction

InactiveCN101807519AReduce processing difficultyIncrease productivitySemiconductor/solid-state device manufacturingDiffusion methodsSynthesis methods
The invention relates to a method for preparing cubic boron nitride (cBN) single crystal-film homogeneous P-N junction, and belongs to a method for preparing semiconductor components. The method comprises the steps of: synthesizing a semiconducting cBN single crystal with semiconductor characteristic and preparing a doped cBN film, wherein the cBN film has the semiconductor characteristic opposite to that of the cBN single crystal; the semiconducting cBN single crystal with the semiconductor characteristic is synthesized by a high-pressure direct synthesis method or a high-pressure re-diffusion method; and the doped cBN film is prepared by taking the semiconducting cBN single crystal with the semiconductor characteristic as a substrate and doping and growing a cBN film with a semiconductor type opposite to a substrate type by a vacuum vapor deposition method. The vacuum vapor deposition method is a vacuum physical vapor deposition method or a vacuum chemical vapor deposition method. The method has the advantages of reduction in processing difficulties, improvement on production efficiency, yield and the like and great improvement compared with the conventional technology for preparing a cBN homogeneous P-N junction by high-pressure systemization and re-growth processes.
Owner:JILIN UNIV

Exhaust gas treatment device of metal organic chemical vapor deposition apparatus and application of exhaust gas treatment device

PendingCN110339673APrevent leakageNo cloggingDispersed particle separationEngineeringChemical vapor deposition
The invention discloses an exhaust gas treatment device of a metal organic chemical vapor deposition apparatus and application of the exhaust gas treatment device. The exhaust gas treatment device comprises an air inlet unit, an absorption unit, a monitor unit and a control unit, wherein the air inlet unit is used for inputting to-be-treated exhaust gas, the absorption unit is provided with a gasexhaust mouth, and is connected with the air inlet unit, and an absorption liquid for absorbing the to-be-treated exhaust gas is arranged in the absorption unit; the monitor unit is used for monitoring parameters of the absorption liquid in the absorption unit and outputting the parameters to the monitor unit, the parameters include the pH value, the ORP value and/or the temperature, and the control unit is used for controlling a servo component in the exhaust gas treatment device according to the parameter values and other signals which are output by the monitor unit, so that the corresponding parameters of the absorption liquid are adjusted. The treatment capability of the device is improved greatly, exhaust gas treatment of at most ten MOCVD devices can be met at the same time, the negative pressure is controlled by Venturi and a fan at the same time, and a wide negative pressure range and high accuracy are achieved.
Owner:DR TECH CO LTD YIXING JIANGSU

Method for producing low-temperature polysilicon thin film transistor with crystallized bottom metals

InactiveCN102013400AImproved high leakage characteristicsSemiconductor/solid-state device manufacturingGas phaseEvaporation
The invention relates to a method for producing a low-temperature polysilicon thin film transistor with crystallized bottom metals, which belongs to the field of photoelectricity. The method for producing a low-temperature polysilicon thin film transistor with crystallized bottom metals is provided by the invention. By utilizing the method, the high current leakage characteristic of the low-temperature polysilicon thin film transistor can be improved. The method comprises a step of enhancing the chemical vapor deposition by plasmas or preparing an amorphous silicon thin film layer through chemical vapor deposition, and a step of utilizing Ni atomic units to plate a Ni metal layer by evaporation or sputtering evaporation, wherein the step of utilizing the Ni atomic units to plate a Ni metal layer by evaporation or sputtering evaporation is performed firstly, and then the step of enhancing the chemical vapor deposition by plasmas or preparing the amorphous silicon thin film layer through chemical vapor deposition is performed.
Owner:SICHUAN CCO DISPLAY TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products